Invention Grant
US08625365B2 Memory device and method using encode values for access error condition detection
有权
存储器件和使用编码值进行访问错误状态检测的方法
- Patent Title: Memory device and method using encode values for access error condition detection
- Patent Title (中): 存储器件和使用编码值进行访问错误状态检测的方法
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Application No.: US13212478Application Date: 2011-08-18
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Publication No.: US08625365B2Publication Date: 2014-01-07
- Inventor: Padmaraj Sanjeevarao , David W. Chrudimsky
- Applicant: Padmaraj Sanjeevarao , David W. Chrudimsky
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
A memory module decodes an address to determine a one or more wordline select pattern, or other spatial select pattern. An encoder determines an encoded value based upon the wordline select pattern that is compared to an expected encode value. The encode value has fewer than twice the number of address bits used to determine the wordline select pattern.
Public/Granted literature
- US20130044558A1 MEMORY DEVICE AND METHOD Public/Granted day:2013-02-21
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