Invention Grant
US08625446B2 Setup of measurement period of time and method for setting 有权
测量时间的设置和设置方法

  • Patent Title: Setup of measurement period of time and method for setting
  • Patent Title (中): 测量时间的设置和设置方法
  • Application No.: US13000861
    Application Date: 2009-07-15
  • Publication No.: US08625446B2
    Publication Date: 2014-01-07
  • Inventor: Takatoshi Ogawa
  • Applicant: Takatoshi Ogawa
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2008-209200 20080815
  • International Application: PCT/JP2009/062804 WO 20090715
  • International Announcement: WO2010/018729 WO 20100218
  • Main IPC: H04W24/00
  • IPC: H04W24/00
Setup of measurement period of time and method for setting
Abstract:
Both a first profile that represents relationships between delay times premeasured over transmission paths and occurrence frequencies of the delay times and measurement periods of time for which the delay times over the transmission paths are measured are stored such that the first profile and the measurement period of time are correlated; a measurement period of time correlated with the first profile is obtained from the storage section if a second profile that represents relationships between delay times measured to obtain the measurement period of time and occurrence frequencies of the delay times is the same profile as the first profile; the delay times over the transmission paths are measured; and a mean value of the delay times measured for the measurement period of time is computed.
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