Invention Grant
- Patent Title: Signal quality estimation for OFDMA systems
- Patent Title (中): OFDMA系统的信号质量估计
-
Application No.: US12035394Application Date: 2008-02-21
-
Publication No.: US08625685B2Publication Date: 2014-01-07
- Inventor: Jong Hyeon Park , Je Woo Kim
- Applicant: Jong Hyeon Park , Je Woo Kim
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Charles Chesney
- Main IPC: H04K1/10
- IPC: H04K1/10 ; H04L27/28

Abstract:
Certain embodiments utilize raw signals to estimate channel quality, as contrasted to utilizing equalized signals or after channel estimation. For example, signal quality may be estimated by calculating powers of pilot sub-carriers and null sub-carriers of the raw signals. To mitigate channel effect, certain embodiments utilize first and/or second order differentiation schemes.
Public/Granted literature
- US20090213919A1 SIGNAL QUALITY ESTIMATION FOR OFDMA SYSTEMS Public/Granted day:2009-08-27
Information query