Invention Grant
- Patent Title: Defect detection in objects using statistical approaches
- Patent Title (中): 使用统计方法在对象中进行缺陷检测
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Application No.: US13121092Application Date: 2009-09-25
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Publication No.: US08626459B2Publication Date: 2014-01-07
- Inventor: Francesco Lanza Di Scalea , Stefano Coccia , Ivan Bartoli , Salvatore Salamone , Piervincenzo Rizzo
- Applicant: Francesco Lanza Di Scalea , Stefano Coccia , Ivan Bartoli , Salvatore Salamone , Piervincenzo Rizzo
- Applicant Address: US CA Oakland
- Assignee: The Regents of the University of California
- Current Assignee: The Regents of the University of California
- Current Assignee Address: US CA Oakland
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- International Application: PCT/US2009/058442 WO 20090925
- International Announcement: WO2010/036934 WO 20100401
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
Disclosed are systems, methods and articles, including an inspection system that includes at least one generator to apply energy to an object at an application point to cause waves to travel, at least partly, through the object. The system further includes at least one detector configured to detect at least a portion of the waves traveling through the object, and a statistical analyzer to perform a statistical analysis based on an output produced by the at least one detector in response to the detected portion of the waves, the statistical analysis being used to determine whether at least one defect is present in the object.
Public/Granted literature
- US20110238336A1 DEFECT DETECTION IN OBJECTS USING STATISTICAL APPROACHES Public/Granted day:2011-09-29
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