Invention Grant
- Patent Title: Data storage device tester
- Patent Title (中): 数据存储设备测试仪
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Application No.: US12749243Application Date: 2010-03-29
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Publication No.: US08626463B2Publication Date: 2014-01-07
- Inventor: Curtis E. Stevens , Lawrence J. Dalphy
- Applicant: Curtis E. Stevens , Lawrence J. Dalphy
- Applicant Address: US CA Irvine
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Irvine
- Main IPC: G01N37/00
- IPC: G01N37/00
Abstract:
A data storage device (DSD) tester is disclosed for testing a DSD. The DSD tester comprises control circuitry operable to receive production line data through an interface, wherein the production line data is related to the DSD. The control circuitry executes a DSD test on the DSD, and transmits failure data generated by the DSD test and the production line data to a failure information database.
Public/Granted literature
- US20110154112A1 DATA STORAGE DEVICE TESTER Public/Granted day:2011-06-23
Information query
