Invention Grant
- Patent Title: In-situ RC-calibration scheme for active RC filter
- Patent Title (中): 有源RC滤波器的原位RC校准方案
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Application No.: US12907586Application Date: 2010-10-19
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Publication No.: US08626469B2Publication Date: 2014-01-07
- Inventor: Dipankar Nag , Mei-Show Chen , Chewn-Pu Jou
- Applicant: Dipankar Nag , Mei-Show Chen , Chewn-Pu Jou
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H03B1/00
- IPC: H03B1/00 ; H03K5/00
Abstract:
A method of calibrating a filter includes applying an input signal into the filter to generate an output signal, measuring a phase difference between the input signal and the output signal; determining a leading/lagging status of the phase difference; calculating a capacitor code (CAP_CODE) using the leading/lagging status; and calibrating the capacitor using the CAP_CODE.
Public/Granted literature
- US20120095715A1 In-Situ RC-Calibration Scheme for Active RC Filter Public/Granted day:2012-04-19
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