Invention Grant
US08626471B2 Method and system for testing and calibrating an accelerometer of an electronic device
有权
用于测试和校准电子设备加速度计的方法和系统
- Patent Title: Method and system for testing and calibrating an accelerometer of an electronic device
- Patent Title (中): 用于测试和校准电子设备加速度计的方法和系统
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Application No.: US12843973Application Date: 2010-07-27
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Publication No.: US08626471B2Publication Date: 2014-01-07
- Inventor: Marc Adam Kennedy , Arkady Ivannikov , Aleksandar Papo
- Applicant: Marc Adam Kennedy , Arkady Ivannikov , Aleksandar Papo
- Applicant Address: CA Waterloo
- Assignee: Blackberry Limited
- Current Assignee: Blackberry Limited
- Current Assignee Address: CA Waterloo
- Agency: Ridout & Maybee LLP
- Main IPC: G01P15/18
- IPC: G01P15/18
Abstract:
A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a method of testing and calibrating an accelerometer of an electronic device, comprising: detecting the electronic device within a nest of a test fixture; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.
Public/Granted literature
- US20110029275A1 METHOD AND SYSTEM FOR TESTING AND CALIBRATING AN ACCELEROMETER OF AN ELECTRONIC DEVICE Public/Granted day:2011-02-03
Information query
