Invention Grant
- Patent Title: Method for the selection of attributes for statistical Learning for object detection and recognition
- Patent Title (中): 选择用于物体检测和识别的统计学习属性的方法
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Application No.: US13201287Application Date: 2010-02-19
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Publication No.: US08626687B2Publication Date: 2014-01-07
- Inventor: Xavier Perrotton , Marc Sturzel
- Applicant: Xavier Perrotton , Marc Sturzel
- Applicant Address: FR Paris
- Assignee: European Aeronautic Defence and Space Company-Eads France
- Current Assignee: European Aeronautic Defence and Space Company-Eads France
- Current Assignee Address: FR Paris
- Agency: Pearne & Gordon LLP
- Priority: FR0951086 20090219
- International Application: PCT/EP2010/052110 WO 20100219
- International Announcement: WO2010/094759 WO 20100826
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06K9/00

Abstract:
The invention relates to an attribute selection method for making statistical learning of descriptors intended to enable automatic recognition and/or detection of an object from a set of images, method characterized by the following steps: obtain a mask of the object in each image containing said object to be recognized, define and select at least one set of descriptors as a function of their geometric shape and/or apparent specific physical characteristics, calculate attributes associated with this shape and said specific physical characteristics, sort the descriptors as a function of their respective scores, select descriptors with the highest scores to perform said statistical learning.
Public/Granted literature
- US20120072383A1 METHOD FOR THE SELECTION OF ATTRIBUTES FOR STATISTICAL LEARNING FOR OBJECT DETECTION AND RECOGNITION Public/Granted day:2012-03-22
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