Invention Grant
- Patent Title: Test slot carriers
- Patent Title (中): 测试槽载体
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Application No.: US12698605Application Date: 2010-02-02
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Publication No.: US08631698B2Publication Date: 2014-01-21
- Inventor: Brian S. Merrow , Valquirio N. Carvalho , John P. Toscano
- Applicant: Brian S. Merrow , Valquirio N. Carvalho , John P. Toscano
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: G01D11/24
- IPC: G01D11/24 ; G01L19/14 ; G11B27/36 ; H05K5/00
Abstract:
A test rack for a storage device testing system includes a plurality of test slot carriers. Each of the test slot carriers includes a plurality of test slot assemblies. The test slot assemblies are configured to received and support storage devices for testing. The test rack also includes a chassis. The chassis includes a plurality of carrier receptacles for releasable receiving and supporting the test slot carriers. The test slot carriers are interchangeable with each other among the various carrier receptacles.
Public/Granted literature
- US20110185811A1 Test Slot Carriers Public/Granted day:2011-08-04
Information query
