Invention Grant
- Patent Title: Methods and apparatus for rapid imprint lithography
- Patent Title (中): 快速压印光刻的方法和装置
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Application No.: US12794971Application Date: 2010-06-07
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Publication No.: US08632720B2Publication Date: 2014-01-21
- Inventor: Wei Zhang , Hua Tan , Stephen Y. Chou
- Applicant: Wei Zhang , Hua Tan , Stephen Y. Chou
- Applicant Address: US NJ Monmouth Junction
- Assignee: Nanonex Corporation
- Current Assignee: Nanonex Corporation
- Current Assignee Address: US NJ Monmouth Junction
- Agency: Polster, Lieder, Woodruff & Lucchesi, LC
- Main IPC: B29C33/46
- IPC: B29C33/46 ; B29C37/00

Abstract:
A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
Public/Granted literature
- US20100244324A1 METHODS AND APPARATUS FOR RAPID IMPRINT LITHOGRAPHY Public/Granted day:2010-09-30
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