Invention Grant
- Patent Title: Wedge imprint patterning of irregular surface
- Patent Title (中): 楔形印记图案不规则表面
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Application No.: US12937810Application Date: 2009-04-17
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Publication No.: US08633052B2Publication Date: 2014-01-21
- Inventor: Benjamin F. Polito , Holly G. Gates , Emanuel M. Sachs
- Applicant: Benjamin F. Polito , Holly G. Gates , Emanuel M. Sachs
- Applicant Address: US MA Bedford US MA Cambridge
- Assignee: 1366 Technologies Inc.,Massachusetts Institute of Technology
- Current Assignee: 1366 Technologies Inc.,Massachusetts Institute of Technology
- Current Assignee Address: US MA Bedford US MA Cambridge
- Agent Steven J. Weissburg
- International Application: PCT/US2009/002423 WO 20090417
- International Announcement: WO2009/128946 WO 20091022
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
Patterned substrates for photovoltaic and other uses are made by pressing a flexible stamp upon a thin layer of resist material, which covers a substrate, such as a wafer. The resist changes phase or becomes flowable, flowing away from locations of impression, revealing the substrate, which is subjected to some shaping process, typically etching. Portions exposed by the stamp being are removed, and portions that protected by the resist, remain. A typical substrate is silicon, and a typical resist is a wax. Workpiece textures include extended grooves, discrete, spaced apart pits, and combinations and intermediates thereof. Platen or rotary patterning apparatus may be used. Rough and irregular workpiece substrates may be accommodated by extended stamp elements. Resist may be applied first to the workpiece, the stamp, or substantially simultaneously, in discrete locations, or over the entire surface of either. The resist dewets the substrate completely where desired.
Public/Granted literature
- US20110129956A1 WEDGE IMPRINT PATTERNING OF IRREGULAR SURFACE Public/Granted day:2011-06-02
Information query
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