Invention Grant
- Patent Title: Apparatus with abnormality determination function and method for determining abnormality
- Patent Title (中): 具有异常判定功能的装置和异常判定方法
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Application No.: US13019470Application Date: 2011-02-02
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Publication No.: US08633683B2Publication Date: 2014-01-21
- Inventor: Shoji Yokoi , Takayuki Sakurai , Tatsuya Okayama , Masanobu Miki , Keizo Iwama , Makoto Hattori , Hidetaka Ozawa
- Applicant: Shoji Yokoi , Takayuki Sakurai , Tatsuya Okayama , Masanobu Miki , Keizo Iwama , Makoto Hattori , Hidetaka Ozawa
- Applicant Address: JP Nagoya JP Minato-Ku
- Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee: NGK Insulators, Ltd.,Honda Motor Co., Ltd.
- Current Assignee Address: JP Nagoya JP Minato-Ku
- Agency: Burr & Brown, PLLC
- Priority: JP2010-025246 20100208
- Main IPC: G01N27/416
- IPC: G01N27/416

Abstract:
The apparatus is provided with an abnormality determination means for determining abnormality of the apparatus where two different combinations of two electrodes are selected from the three electrodes, an alternating-current voltage is applied to an electrode in one combination by the voltage-applying portion to measure a value of a current flowing to the other electrode via the dielectric body by electrostatic coupling, an alternating-current voltage is applied to an electrode in another combination out of the at least two different combinations by the voltage-applying portion to measure a value of a current flowing to the other electrode via the dielectric body by electrostatic coupling, and an abnormality of the apparatus is determined from the current values measured.
Public/Granted literature
- US20110192211A1 APPARATUS WITH ABNORMALITY DETERMINATION FUNCTION AND METHOD FOR DETERMINING ABNORMALITY Public/Granted day:2011-08-11
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