Invention Grant
- Patent Title: Electronic device and operation detection method
- Patent Title (中): 电子设备和操作检测方法
-
Application No.: US13074332Application Date: 2011-03-29
-
Publication No.: US08633712B2Publication Date: 2014-01-21
- Inventor: Shigeaki Maruyama
- Applicant: Shigeaki Maruyama
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sherr & Jiang, PLLC
- Priority: JPP2010-088283 20100407
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
An electronic device includes an input plane member that includes a plurality of first conductive layers that is elastically deformed when a pressing operation is received from a user, a base that includes a plurality of second conductive layers that comes in contact with the first conductive layer when the input plane member is deformed, a capacitance detection unit that detects capacitance between the plurality of first conductive layers and between the plurality of second conductive layers, a resistance value detection unit that detects a resistance value between the first conductive layer and the second conductive layer when the first conductive layer comes in contact with the second conductive layer, and a switch unit that controls electrical connection between the first conductive layer and the second conductive layer and either of the capacitance detection unit and the resistance value detection unit.
Public/Granted literature
- US20110248728A1 ELECTRONIC DEVICE AND OPERATION DETECTION METHOD Public/Granted day:2011-10-13
Information query