A probe-unit base member having high rigidity and requiring no troublesome operations for its manufacture and a probe unit are provided. To achieve the purpose, the probe-unit base member includes a conductive substrate 41 that has a first opening 41a capable of fitting therein a probe holder 3 and a second opening 41b communicated with the first opening 41a; a coating 42 that is made of an insulating adhesive agent and is coated at least on an edge of the second opening 41b; and an insulating guide member 43 that is bonded to the edge of the second opening 41b through the coating 42 and guides one of two contact bodies to a position in contact with probes 2.