Invention Grant
US08633749B2 Phase-locked loop (PLL) fail-over circuit technique and method to mitigate effects of single-event transients
失效
锁相环(PLL)故障切换电路技术和方法来减轻单事件瞬变的影响
- Patent Title: Phase-locked loop (PLL) fail-over circuit technique and method to mitigate effects of single-event transients
- Patent Title (中): 锁相环(PLL)故障切换电路技术和方法来减轻单事件瞬变的影响
-
Application No.: US13560774Application Date: 2012-07-27
-
Publication No.: US08633749B2Publication Date: 2014-01-21
- Inventor: Derek E. Bass , John W. Pfeil
- Applicant: Derek E. Bass , John W. Pfeil
- Applicant Address: US CO Colorado Springs
- Assignee: Aeroflex Colorado Springs Inc.
- Current Assignee: Aeroflex Colorado Springs Inc.
- Current Assignee Address: US CO Colorado Springs
- Agency: Hogan Lovells US LLP
- Agent William J. Kubida; Peter J. Meza
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A PLL fail-over circuit technique and method to mitigate the effects of single-event transients comprises providing a pair of substantially identical phase-locked loops and producing a respective delayed clock signal from each. The outputs of the phase-locked loops are monitored for errors comprising high frequency transients or differences in clock signal outputs from a reference frequency. A clock out signal is output representative of the first delayed clock signal if an error is detected in the second phase-locked loop and the second delayed clock signal is output if an error is detected in the first phase-locked loop.
Public/Granted literature
Information query