Invention Grant
- Patent Title: Monitoring of optical defects in an image capture system
- Patent Title (中): 监控图像捕获系统中的光学缺陷
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Application No.: US13144293Application Date: 2010-01-11
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Publication No.: US08634004B2Publication Date: 2014-01-21
- Inventor: Cesar Douady , Frederic Guichard , Imene Tarchouna
- Applicant: Cesar Douady , Frederic Guichard , Imene Tarchouna
- Applicant Address: FR Billancourt
- Assignee: DXO Labs
- Current Assignee: DXO Labs
- Current Assignee Address: FR Billancourt
- Agency: Kilpatrick Townsend & Stockton LLP
- Agent Dean W. Russell; Renae Bailey Wainwright
- Priority: FR0950192 20090114
- International Application: PCT/FR2010/050034 WO 20100111
- International Announcement: WO2010/081982 WO 20100722
- Main IPC: H04N9/64
- IPC: H04N9/64 ; H04N17/02

Abstract:
Method of monitoring an image capture system (1) comprising a sensor (C) comprising a plurality of photosensitive elements (Z1, Z2, Zn) and an optical device (L) for focusing the light emitted from a scene towards the sensor. This method comprises the obtaining (100) of respective responses of certain at least of the photosensitive elements (E1, E1′, P1, P2) of the sensor to an exposure of the image capture system to any scene (S), followed by a determination (200) of at least one deviation (Δ) between at least one quantity (G) deduced from the responses obtained and at least one reference quantity (Gref). These steps may be followed by an estimation (300) of an optical effect of the image capture system (1) on the basis of said deviation (Δ) determined and optionally by an implementation of an action able to at least partially compensate (400) for the estimated optical defect.
Public/Granted literature
- US20110273569A1 MONITORING OF OPTICAL DEFECTS IN AN IMAGE CAPTURE SYSTEM Public/Granted day:2011-11-10
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