Invention Grant
US08634014B2 Imaging device analysis systems and imaging device analysis methods
有权
成像设备分析系统和成像设备分析方法
- Patent Title: Imaging device analysis systems and imaging device analysis methods
- Patent Title (中): 成像设备分析系统和成像设备分析方法
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Application No.: US11054210Application Date: 2005-02-08
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Publication No.: US08634014B2Publication Date: 2014-01-21
- Inventor: Timothy L. Kohler , Steven D. Stoecker , Jeffrey M. DiCarlo , Les Gehman , Gary J. Dispoto , Eric Montgomery , Casey L. Miller
- Applicant: Timothy L. Kohler , Steven D. Stoecker , Jeffrey M. DiCarlo , Les Gehman , Gary J. Dispoto , Eric Montgomery , Casey L. Miller
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: H04N5/225
- IPC: H04N5/225 ; H04N5/228 ; H04N5/232

Abstract:
Imaging device analysis systems and imaging device analysis methods are described. According to one embodiment, an imaging device analysis system includes a light source configured to output light for use in analyzing at least one imaging component of an imaging device, wherein the imaging device is configured to generate images responsive to received light, and processing circuitry coupled with the light source and configured to control the light source to optically communicate the light to the imaging device, wherein the processing circuitry is further configured to access image data generated by the imaging device responsive to the reception, by the imaging device, of the light from the light source and to process the image data to analyze an operational status of the at least one imaging component.
Public/Granted literature
- US20050219363A1 Imaging device analysis systems and imaging device analysis methods Public/Granted day:2005-10-06
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