Invention Grant
US08634079B2 Attraction state inspection device, surface mounting apparatus, and part test device
有权
吸引状态检查装置,表面安装装置和部件测试装置
- Patent Title: Attraction state inspection device, surface mounting apparatus, and part test device
- Patent Title (中): 吸引状态检查装置,表面安装装置和部件测试装置
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Application No.: US13468420Application Date: 2012-05-10
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Publication No.: US08634079B2Publication Date: 2014-01-21
- Inventor: Tadashi Onishi
- Applicant: Tadashi Onishi
- Applicant Address: JP Shizuoka-Ken
- Assignee: Yamaha Hatsudoki Kabushiki Kaisha
- Current Assignee: Yamaha Hatsudoki Kabushiki Kaisha
- Current Assignee Address: JP Shizuoka-Ken
- Agency: Studebaker & Brackett PC
- Priority: JP2011-106924 20110512
- Main IPC: G01N21/47
- IPC: G01N21/47

Abstract:
An attraction state inspection device includes a diffusion member that is disposed inside a nozzle group in which a plurality of nozzles that attract parts are disposed, and transmits incident light while diffusing the light, an image pickup is disposed on a side of the nozzle group apart from the diffusion member in a first direction, picks up an image of a part attracted by one nozzle positioned in the first direction with respect to the diffusion member, from among the plurality of nozzles, against a background of the diffusion member, and obtains an image of the part, an irradiation unit that is disposed opposite the image pickup unit with the diffusion member interposed therebetween, and radiates light toward the nozzle group, and an inspection unit that inspects an attraction state of the part on the basis of the image of the picked up part.
Public/Granted literature
- US20120287437A1 ATTRACTION STATE INSPECTION DEVICE, SURFACE MOUNTING APPARATUS, AND PART TEST DEVICE Public/Granted day:2012-11-15
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