Invention Grant
- Patent Title: Signal measuring device and signal measuring method
- Patent Title (中): 信号测量装置及信号测量方法
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Application No.: US12519837Application Date: 2007-12-19
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Publication No.: US08635040B2Publication Date: 2014-01-21
- Inventor: Koichi Nose , Masayuki Mizuno , Atsufumi Shibayama
- Applicant: Koichi Nose , Masayuki Mizuno , Atsufumi Shibayama
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2006-344648 20061221
- International Application: PCT/JP2007/074396 WO 20071219
- International Announcement: WO2008/075702 WO 20080626
- Main IPC: G01R13/02
- IPC: G01R13/02

Abstract:
A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal.
Public/Granted literature
- US20100042373A1 SIGNAL MEASURING DEVICE AND SIGNAL MEASURING METHOD Public/Granted day:2010-02-18
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