Invention Grant
US08635575B2 System and method to improve chip yield, reliability and performance
有权
提高芯片产量,可靠性和性能的系统和方法
- Patent Title: System and method to improve chip yield, reliability and performance
- Patent Title (中): 提高芯片产量,可靠性和性能的系统和方法
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Application No.: US13471627Application Date: 2012-05-15
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Publication No.: US08635575B2Publication Date: 2014-01-21
- Inventor: Henry A. Bonges, III
- Applicant: Henry A. Bonges, III
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Richard Kotulak
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Improving semiconductor chip yield and reliability by connecting adjacent metal traces that are on a same network with metal shorts. This reduces and/or eliminates the need for redundant vias formerly employed in semiconductor chip design. Additionally, the metal shorts are placed in conformance with one or more pre-determined design rules. Once placed, the metal shorts are checked to ensure that each metal short connects groundrule clean, thereby ensuring the placement is correct-by-construction.
Public/Granted literature
- US20120227025A1 SYSTEM AND METHOD TO IMPROVE CHIP YEILD, RELIABILITY AND PERFORMANCE Public/Granted day:2012-09-06
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