Invention Grant
US08637366B2 Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states
有权
不具有高阻抗状态和低阻抗状态的介质反熔丝的非易失性存储单元
- Patent Title: Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states
- Patent Title (中): 不具有高阻抗状态和低阻抗状态的介质反熔丝的非易失性存储单元
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Application No.: US10955549Application Date: 2004-09-29
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Publication No.: US08637366B2Publication Date: 2014-01-28
- Inventor: S. Brad Herner , Andrew J. Walker
- Applicant: S. Brad Herner , Andrew J. Walker
- Applicant Address: US CA Milpitas
- Assignee: Sandisk 3D LLC
- Current Assignee: Sandisk 3D LLC
- Current Assignee Address: US CA Milpitas
- Agency: Dugan & Dugan, PC
- Main IPC: H01L29/80
- IPC: H01L29/80

Abstract:
A memory cell according to the present invention comprises a bottom conductor, a doped semiconductor pillar, and a top conductor. The memory cell does not include a dielectric rupture antifuse separating the doped semiconductor pillar from either conductor, or within the semiconductor pillar. The memory cell is formed in a high-impedance state, in which little or no current flows between the conductors on application of a read voltage. Application of a programming voltage programs the cell, converting the memory cell from its initial high-impedance state to a low-impedance state. A monolithic three dimensional memory array of such cells can be formed, comprising multiple memory levels, the levels monolithically formed above one another.
Public/Granted literature
- US20050052915A1 Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states Public/Granted day:2005-03-10
Information query
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