Invention Grant
- Patent Title: Semiconductor device heat dissipation structure
- Patent Title (中): 半导体器件散热结构
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Application No.: US13742508Application Date: 2013-01-16
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Publication No.: US08637388B2Publication Date: 2014-01-28
- Inventor: Michael J. Abou-Khalil , Robert J. Gauthier , Tom C. Lee , Junjun Li , Souvick Mitra , Christopher S. Putnam
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Anthony J. Canale
- Main IPC: H01L21/768
- IPC: H01L21/768

Abstract:
A heat generating component of a semiconductor device is located between two heavily doped semiconductor regions in a semiconductor substrate. The heat generating component may be a middle portion of a diode having a light doping, a lightly doped p-n junction between a cathode and anode of a silicon controlled rectifier, or a resistive portion of a doped semiconductor resistor. At least one thermally conductive via comprising a metal or a non-metallic conductive material is place directly on the heat generating component. Alternatively, a thin dielectric layer may be formed between the heat generating component and the at least one thermally conductive via. The at least one thermally conductive via may, or may not, be connected to a back-end-of-line metal wire, which may be connected to higher level of metal wiring or to a handle substrate through a buried insulator layer.
Public/Granted literature
- US20130127063A1 SEMICONDUCTOR DEVICE HEAT DISSIPATION STRUCTURE Public/Granted day:2013-05-23
Information query
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