Invention Grant
- Patent Title: Atmospheric pressure ionization mass spectrometer
- Patent Title (中): 大气压电离质谱仪
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Application No.: US13806680Application Date: 2010-06-24
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Publication No.: US08637810B2Publication Date: 2014-01-28
- Inventor: Kazuo Mukaibatake , Daisuke Okumura
- Applicant: Kazuo Mukaibatake , Daisuke Okumura
- Applicant Address: JP Kyoto-Shi
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-Shi
- Agency: Bingham McCutchen LLP
- International Application: PCT/JP2010/060708 WO 20100624
- International Announcement: WO2011/161788 WO 20111229
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
In a first-stage intermediate vacuum chamber, cluster ions causing a background noise are dominantly formed in area (A), while fragment ions are dominantly generated in area (B). Taking this fact into account, in an in-source CID analysis mode, a DC voltage higher than that applied to a skimmer is applied to a first ion guide so as to create an accelerating electric field in area (B), whereby the ions are sufficiently energized to promote the fragmentation. When the in-source CID is not performed, a DC voltage higher than that applied to the first ion guide is applied to the exit end of a desolvation tube so as to create an accelerating electric field only in area (A) without creating such a field in area (B), whereby both the formation of the cluster ions and the generation of the fragment ions are suppressed, so that a high-quality chromatogram can be obtained.
Public/Granted literature
- US20130092835A1 Atmospheric Pressure Ionization Mass Spectrometer Public/Granted day:2013-04-18
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