Invention Grant
US08637815B2 Charged particle analysers and methods of separating charged particles
有权
带电粒子分析仪和分离带电粒子的方法
- Patent Title: Charged particle analysers and methods of separating charged particles
- Patent Title (中): 带电粒子分析仪和分离带电粒子的方法
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Application No.: US13375150Application Date: 2010-05-27
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Publication No.: US08637815B2Publication Date: 2014-01-28
- Inventor: Alexander A. Makarov , Anastassios Giannakopulos
- Applicant: Alexander A. Makarov , Anastassios Giannakopulos
- Applicant Address: DE Bremen
- Assignee: Thermo Fisher Scientific (Bremen) GmbH
- Current Assignee: Thermo Fisher Scientific (Bremen) GmbH
- Current Assignee Address: DE Bremen
- Agent Charles B. Katz
- Priority: GB0909232.1 20090529
- International Application: PCT/EP2010/057340 WO 20100527
- International Announcement: WO2010/136533 WO 20101202
- Main IPC: H01J49/40
- IPC: H01J49/40

Abstract:
Methods and analysers useful for time of flight mass spectrometry are provided. A method of separating charged particles comprises the steps of: providing an analyser comprising two opposing mirrors each mirror comprising inner and outer field-defining electrode systems elongated along an axis z, the outer system surrounding the inner and defining therebetween an analyser volume, the mirrors creating an electrical field within the analyser volume comprising opposing electrical fields along z, the strength along z of the electrical field being a minimum at a plane z=0; causing a beam of charged particles to fly through the analyser, orbiting around the z axis within the analyser volume, reflecting from one mirror to the other at least once thereby defining a maximum turning point within a mirror; the strength along z of the electrical field at the maximum turning point being X and the absolute strength along z of the electrical field being less than |X|/2 for not more than ⅔ of the distance along z between the plane z=0 and the maximum turning point in each mirror; separating the charged particles according to their flight times; and ejecting at least some of the charged particles having a plurality of m/z from the analyser or detecting the at least some of charged particles having a plurality of m/z, the ejecting or detecting being performed after the particles have undergone the same number of orbits around the axis z.
Public/Granted literature
- US20120138785A1 Charged Particle Analysers And Methods Of Separating Charged Particles Public/Granted day:2012-06-07
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