Invention Grant
- Patent Title: Radiation detection element
- Patent Title (中): 辐射检测元件
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Application No.: US12979168Application Date: 2010-12-27
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Publication No.: US08637828B2Publication Date: 2014-01-28
- Inventor: Yoshihiro Okada
- Applicant: Yoshihiro Okada
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-019406 20100129
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
The present invention provides a radiation detection element that allows repairing of a defect portion, and that minimizes the number of pixels from which charges cannot be read out when repaired. Namely, in two adjacent pixels that are connected to a signal line having a defect portion where a defect has occurred and that are adjacent to the defect portion, the signal lines and the parallel lines are short-circuited to configure a parallel circuit parallel to the defect portion.
Public/Granted literature
- US20110186742A1 RADIATION DETECTION ELEMENT Public/Granted day:2011-08-04
Information query
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