Invention Grant
- Patent Title: Charged particle irradiation system and method for controlling the same
- Patent Title (中): 带电粒子照射系统及其控制方法
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Application No.: US12892225Application Date: 2010-09-28
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Publication No.: US08637837B2Publication Date: 2014-01-28
- Inventor: Takayoshi Natori , Kunio Moriyama , Koji Matsuda
- Applicant: Takayoshi Natori , Kunio Moriyama , Koji Matsuda
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2009-226878 20090930
- Main IPC: G21G5/00
- IPC: G21G5/00

Abstract:
A beam extraction process (interruption and restart) is appropriately performed when a failure occurs during irradiation of a spot group. A charged particle irradiation system includes a synchrotron 12 and a scanning irradiation unit 15 that scans an ion beam extracted from the synchrotron over a subject. The extraction of the ion beam from the synchrotron is stopped on the basis of a beam extraction stop command. Scanning magnets 5A and 5B are controlled to change a point (spot) to be irradiated with the ion beam, while the extraction of the ion beam is stopped. The extraction of the ion beam from the synchrotron is restarted after the change of the spot to be irradiated. When a relatively minor failure in which continuous irradiation would be possible occurs during irradiation of a certain spot with the beam, the extraction of the beam is not immediately stopped.
Public/Granted literature
- US20110073778A1 CHARGED PARTICLE IRRADIATION SYSTEM AND METHOD FOR CONTROLLING THE SAME Public/Granted day:2011-03-31
Information query
IPC分类:
G | 物理 |
G21 | 核物理;核工程 |
G21G | 化学元素的转变;放射源 |
G21G5/00 | 通过化学反应进行化学元素的推断转变 |