Invention Grant
- Patent Title: Vertical nanowire FET devices
- Patent Title (中): 垂直纳米线FET器件
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Application No.: US12984653Application Date: 2011-01-05
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Publication No.: US08637849B2Publication Date: 2014-01-28
- Inventor: Hariklia Deligianni , Qiang Huang , Lubomyr T. Romankiw
- Applicant: Hariklia Deligianni , Qiang Huang , Lubomyr T. Romankiw
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Ryan, Mason & Lewis, LLP
- Agent Louis J. Percello
- Main IPC: H01L29/06
- IPC: H01L29/06

Abstract:
A Vertical Field Effect Transistor (VFET) formed on a substrate, with a conductive bottom electrode formed thereon. A bottom dielectric spacer layer and a gate dielectric layer surrounded by a gate electrode are formed thereabove. Thereabove is an upper spacer layer. A pore extends therethrough between the electrodes. A columnar Vertical Semiconductor Nanowire (VSN) fills the pore and between the top and bottom electrodes. An FET channel is formed in a central region of the VSN between doped source and drain regions at opposite ends of the VSN. The gate dielectric structure, that is formed on an exterior surface of the VSN above the bottom dielectric spacer layer, separates the VSN from the gate electrode.
Public/Granted literature
- US20110108803A1 VERTICAL NANOWIRE FET DEVICES Public/Granted day:2011-05-12
Information query
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