Invention Grant
- Patent Title: Semiconductor device and method of testing the same
- Patent Title (中): 半导体器件及其测试方法
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Application No.: US13525707Application Date: 2012-06-18
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Publication No.: US08637988B2Publication Date: 2014-01-28
- Inventor: Jong-Hyun Lee
- Applicant: Jong-Hyun Lee
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2011-0118439 20111114
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
There is provided a semiconductor device comprising, a first metal pattern formed at a first metal level and extending in a first direction, a second metal pattern formed at the first metal level, extending in a second direction that is different than the first direction, and disposed on a side of the first metal pattern to be separated from the first metal pattern, a first via structure formed on the first metal pattern, a third metal pattern formed at a second metal level that is different than the first metal level and electrically connected to the first metal pattern by the first via structure, and a first pad electrically connected to the first metal pattern and a second pad electrically connected to the third metal pattern.
Public/Granted literature
- US20130119554A1 SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME Public/Granted day:2013-05-16
Information query
IPC分类: