Invention Grant
- Patent Title: Delay locked loop
- Patent Title (中): 延迟锁定环路
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Application No.: US13448547Application Date: 2012-04-17
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Publication No.: US08638137B2Publication Date: 2014-01-28
- Inventor: Jin Il Chung
- Applicant: Jin Il Chung
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2011-0063779 20110629
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
A semiconductor device includes a delay unit configured to delay an inputted clock to generate a delay clock, a selection unit configured to select and output one of the inputted clock and the delay clock, a delay locked loop configured to perform a delay locking operation using a signal delivered from the selection unit, and a selection control unit configured to control the selection unit in response to a comparison of one period of the inputted clock and a maximum delay value of the delay locked loop.
Public/Granted literature
- US20130002322A1 SEMICONDUCTOR DEVICE Public/Granted day:2013-01-03
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