Invention Grant
US08638422B2 Exposure method, exposure apparatus, method for producing device, and method for evaluating exposure apparatus
有权
曝光方法,曝光装置,制造装置的方法以及曝光装置的评价方法
- Patent Title: Exposure method, exposure apparatus, method for producing device, and method for evaluating exposure apparatus
- Patent Title (中): 曝光方法,曝光装置,制造装置的方法以及曝光装置的评价方法
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Application No.: US11886506Application Date: 2006-03-17
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Publication No.: US08638422B2Publication Date: 2014-01-28
- Inventor: Kenichi Shiraishi
- Applicant: Kenichi Shiraishi
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2005-079110 20050318
- International Application: PCT/JP2006/005345 WO 20060317
- International Announcement: WO2006/101024 WO 20060928
- Main IPC: G03B27/32
- IPC: G03B27/32 ; G03B27/42 ; G03B27/52 ; G03B27/58 ; G03C5/00

Abstract:
An exposure method includes a first step for measuring position information of a substrate while controlling a substrate stage to move the substrate stage in a state that an optical path space is filled with a liquid under a predetermined condition; a second step for obtaining a movement control accuracy of the substrate stage based on a result of the measurement; a third step for determining an exposure condition, for exposing the substrate, based on the obtained movement control accuracy; and a fourth step for exposing the substrate based on the determined exposure condition. This makes it possible to satisfactorily expose the substrate at the time of exposing the substrate based on the liquid immersion method.
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