A measurement system comprising an elongated member, a distal member connected to an end of the elongated member, the distal member having one or more register members to define a reference point(s), and a beam measurement device mounted to the distal member and configured to generate a beam at least a portion of the beam having a first axis essentially perpendicular to the reference point(s), the beam measurement device determining distance data based on the reflection of at least a portion of the beam.