Invention Grant
- Patent Title: Dual port static random access memory cell
- Patent Title (中): 双端口静态随机存取存储单元
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Application No.: US13228001Application Date: 2011-09-08
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Publication No.: US08638592B2Publication Date: 2014-01-28
- Inventor: Sayeed A. Badrudduza , Jack M. Higman , Sanjay R. Parihar
- Applicant: Sayeed A. Badrudduza , Jack M. Higman , Sanjay R. Parihar
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent James L. Clingan, Jr.; David G. Dolezal
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
An SRAM has at least two sets of pass transistors for coupling at least two sets of bit lines to true and complement data nodes of an SRAM cell based on the assertion of at least two word lines. The cell includes two pull up transistors and two pull down transistors coupled to the true and complement data nodes. None of the pass transistors are implemented in an active area that includes a pull up transistor or a pull down transistor of the cell.
Public/Granted literature
- US20130064003A1 DUAL PORT STATIC RANDOM ACCESS MEMORY CELL Public/Granted day:2013-03-14
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