Invention Grant
- Patent Title: X-ray imaging apparatus and method of X-ray imaging
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US12993083Application Date: 2010-01-15
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Publication No.: US08638903B2Publication Date: 2014-01-28
- Inventor: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc. IP Division
- Priority: JP2009-006862 20090115; JP2009-264411 20091119
- International Application: PCT/JP2010/050748 WO 20100115
- International Announcement: WO2010/082687 WO 20100722
- Main IPC: G03H5/00
- IPC: G03H5/00 ; G01N23/04

Abstract:
Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained.X-rays are spatially split, and a first attenuation element in which the transmission amount of X-rays continuously changes in accordance with the displacement when the X-rays pass through an object is used. Transmittance is calculated by using the first attenuation element and a second attenuation element that is different from the first attenuation element with respect to an amount of change or a characteristic of change in the transmission amount of X-rays in a direction of a displacement of the X-rays. A differential phase image and the like of the object are calculated using the transmittance.
Public/Granted literature
- US20110103549A1 X-RAY IMAGING APPARATUS AND METHOD OF X-RAY IMAGING Public/Granted day:2011-05-05
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