Invention Grant
- Patent Title: Mixture general diagnostic model
- Patent Title (中): 混合物一般诊断模型
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Application No.: US11852075Application Date: 2007-09-07
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Publication No.: US08639176B2Publication Date: 2014-01-28
- Inventor: Matthias Von Davier , Kentaro Yamamoto , Xueli Xu
- Applicant: Matthias Von Davier , Kentaro Yamamoto , Xueli Xu
- Applicant Address: US NJ Princeton
- Assignee: Educational Testing System
- Current Assignee: Educational Testing System
- Current Assignee Address: US NJ Princeton
- Agency: Jones Day
- Main IPC: G09B7/00
- IPC: G09B7/00

Abstract:
Disclosed herein is a method of analyzing examinee item response data comprising constructing a diagnosis model for reporting skill profiles of examinees, wherein the diagnosis model comprises at least a variable representing unobserved subpopulations, creating an item design matrix, distributing examinees across the unobserved subpopulations, iteratively estimating values for a plurality of variables within the diagnosis model, and reporting the estimated values to a user.
Public/Granted literature
- US20080076108A1 MIXTURE GENERAL DIAGNOSTIC MODEL Public/Granted day:2008-03-27
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