Invention Grant
US08639857B2 Extended input/output measurement word facility for obtaining measurement data 有权
用于获取测量数据的扩展输入/输出测量字设备

Extended input/output measurement word facility for obtaining measurement data
Abstract:
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
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