Invention Grant
US08639865B2 Method and apparatus for calibrating a memory interface with a number of data patterns
有权
用于校准具有多个数据模式的存储器接口的方法和装置
- Patent Title: Method and apparatus for calibrating a memory interface with a number of data patterns
- Patent Title (中): 用于校准具有多个数据模式的存储器接口的方法和装置
-
Application No.: US13280714Application Date: 2011-10-25
-
Publication No.: US08639865B2Publication Date: 2014-01-28
- Inventor: Terry M. Grunzke
- Applicant: Terry M. Grunzke
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/00

Abstract:
Apparatuses and methods of calibrating a memory interface are described. Calibrating a memory interface can include loading and outputting units of a first data pattern into and from at least a portion of a register to generate a first read capture window. Units of a second data pattern can be loaded into and output from at least the portion of the register to generate a second read capture window. One of the first read capture window and the second read capture window can be selected and a data capture point for the memory interface can be calibrated according to the selected read capture window.
Public/Granted literature
- US20130103890A1 CALIBRATING MEMORY Public/Granted day:2013-04-25
Information query