Invention Grant
- Patent Title: Electric wire testing apparatus and electric wire processor equipped therewith
- Patent Title (中): 配备电线检测装置及电线加工装置
-
Application No.: US13109198Application Date: 2011-05-17
-
Publication No.: US08640326B2Publication Date: 2014-02-04
- Inventor: Tetsuya Yano , Etsuro Nishida
- Applicant: Tetsuya Yano , Etsuro Nishida
- Applicant Address: JP Hyogo
- Assignee: Shinmaywa Industries, Ltd.
- Current Assignee: Shinmaywa Industries, Ltd.
- Current Assignee Address: JP Hyogo
- Agency: Keating & Bennett, LLP
- Priority: JP2010-195382 20100901
- Main IPC: H01R43/28
- IPC: H01R43/28 ; G01N21/952

Abstract:
An electric wire testing apparatus tests the condition of an end portion of an electric wire including a plurality of core wires and a sheath for covering the core wires. The electric wire testing apparatus includes an imaging device arranged to photograph an end surface of the core wires that have been exposed by stripping off the sheath, a counting unit arranged to count the number of the core wires from an image photographed by the imaging device, and a determining unit arranged to determine pass/fail of the condition of the end portion of the electric wire based on whether or not the number of the core wires counted by the counting unit matches a predetermined number.
Public/Granted literature
- US20120047724A1 ELECTRIC WIRE TESTING APPARATUS AND ELECTRIC WIRE PROCESSOR EQUIPPED THEREWITH Public/Granted day:2012-03-01
Information query