Invention Grant
- Patent Title: Method of forming titanium nitride film
- Patent Title (中): 形成氮化钛膜的方法
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Application No.: US13404547Application Date: 2012-02-24
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Publication No.: US08642127B2Publication Date: 2014-02-04
- Inventor: Yuichiro Morozumi , Shingo Hishiya , Katsushige Harada
- Applicant: Yuichiro Morozumi , Shingo Hishiya , Katsushige Harada
- Applicant Address: JP
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2011-041635 20110228; JP2012-006562 20120116
- Main IPC: C23C16/34
- IPC: C23C16/34

Abstract:
According to the method of forming a titanium nitride film, first, an inside of a reaction pipe accommodating a semiconductor wafer is heated up to 200° C. to 350° C. by using a temperature increasing heater. Then, the titanium nitride film is formed on the semiconductor wafer by supplying a film forming gas including a titanium raw material into the reaction pipe. Methylcyclopentadienyl tris(dimethylamino)titanium that does not include a chlorine atom and includes titanium is used as the titanium raw material.
Public/Granted literature
- US20120219710A1 METHOD OF FORMING TITANIUM NITRIDE FILM, APPARATUS FOR FORMING TITANIUM NITRIDE FILM, AND PROGRAM Public/Granted day:2012-08-30
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