Invention Grant
US08643135B2 Edge termination configurations for high voltage semiconductor power devices 有权
高压半导体功率器件的边缘端接配置

Edge termination configurations for high voltage semiconductor power devices
Abstract:
This invention discloses a semiconductor power device disposed in a semiconductor substrate and having an active cell area and an edge termination area wherein the edge termination area comprises a wide trench filled with a field-crowding reduction filler and a buried field plate buried under a top surface of the semiconductor substrate and laterally extended over a top portion of the field crowding field to move a peak electric field laterally away from the active cell area. In a specific embodiment, the field-crowding reduction filler comprises a silicon oxide filled in the wide trench.
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