Invention Grant
- Patent Title: Calibration of temperature sensitive circuits with heater elements
- Patent Title (中): 用加热器元件校准温度敏感电路
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Application No.: US13541077Application Date: 2012-07-03
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Publication No.: US08643174B2Publication Date: 2014-02-04
- Inventor: Terje Saether
- Applicant: Terje Saether
- Applicant Address: US CA San Jose
- Assignee: Atmel Corporation
- Current Assignee: Atmel Corporation
- Current Assignee Address: US CA San Jose
- Agency: Fish & Richardson P.C.
- Main IPC: H01L21/02
- IPC: H01L21/02
Abstract:
One or more heating elements are disposed on a semiconductor substrate proximate a temperature sensitive circuit disposed on the substrate (e.g., bandgap circuit, oscillator). The heater element(s) can be controlled to heat the substrate and elevate the temperature of the circuit to one or more temperature points. One or more temperature measurements can be made at each of the one or more temperature points for calibrating one or more reference values of the circuit (e.g., bandgap voltage).
Public/Granted literature
- US20120268217A1 Calibration of Temperature Sensitive Circuits with Heater Elements Public/Granted day:2012-10-25
Information query
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