Invention Grant
US08643382B2 Apparatus and method for testing a capacitive transducer and/or associated electronic circuitry
有权
用于测试电容式换能器和/或相关电子电路的装置和方法
- Patent Title: Apparatus and method for testing a capacitive transducer and/or associated electronic circuitry
- Patent Title (中): 用于测试电容式换能器和/或相关电子电路的装置和方法
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Application No.: US12649623Application Date: 2009-12-30
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Publication No.: US08643382B2Publication Date: 2014-02-04
- Inventor: Colin Findlay Steele , John Laurence Pennock
- Applicant: Colin Findlay Steele , John Laurence Pennock
- Applicant Address: GB Edinburgh
- Assignee: Wolfson Microelectronics plc
- Current Assignee: Wolfson Microelectronics plc
- Current Assignee Address: GB Edinburgh
- Agency: Dickstein Shapiro LLP
- Priority: GB0823664.8 20081230
- Main IPC: G01R31/12
- IPC: G01R31/12 ; G01R31/08
Abstract:
A method of testing a capacitive transducer circuit, for example a MEMS capacitive transducer, by applying a test signal via one or more capacitors provided in the transducer circuit.
Public/Granted literature
- US20100219839A1 APPARATUS AND METHOD FOR TESTING A CAPACITIVE TRANSDUCER AND/OR ASSOCIATED ELECTRONIC CIRCUITRY Public/Granted day:2010-09-02
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