Invention Grant
- Patent Title: Advance manufacturing monitoring and diagnostic tool
- Patent Title (中): 先进的制造监控和诊断工具
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Application No.: US12551635Application Date: 2009-09-01
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Publication No.: US08643539B2Publication Date: 2014-02-04
- Inventor: Gerald William Pauly , Walter John Keller, III
- Applicant: Gerald William Pauly , Walter John Keller, III
- Applicant Address: US PA Charleroi
- Assignee: Nokomis, Inc.
- Current Assignee: Nokomis, Inc.
- Current Assignee Address: US PA Charleroi
- Agency: James Ray & Assoc
- Main IPC: G01S7/40
- IPC: G01S7/40 ; G01S13/00 ; G21C17/00 ; G01N37/00 ; G01R31/00 ; G01R31/02 ; G01R31/04 ; G01R31/302 ; G01R31/265
Abstract:
The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component.
Public/Granted literature
- US20100123453A1 ADVANCE MANUFACTURING MONITORING AND DIAGNOSTIC TOOL Public/Granted day:2010-05-20
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