Invention Grant
- Patent Title: Method for self-calibration of frequency offsets
- Patent Title (中): 频率偏移自校准方法
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Application No.: US13014355Application Date: 2011-01-26
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Publication No.: US08643542B2Publication Date: 2014-02-04
- Inventor: Jan Wendel
- Applicant: Jan Wendel
- Applicant Address: DE Taufkirchen
- Assignee: Astrium GmbH
- Current Assignee: Astrium GmbH
- Current Assignee Address: DE Taufkirchen
- Agency: Crowell & Moring LLP
- Priority: EP10001162 20100204
- Main IPC: G01S19/23
- IPC: G01S19/23

Abstract:
A method for self-calibration of frequency offsets in a measurement equipment of an interference monitoring system is provided. The method involves sampling I/Q data using the interference monitoring system measurement equipment and acquiring satellite navigation signals from the I/Q data. A carrier frequency of the satellite navigation signal is estimated and an expected carrier frequency of the satellite navigation signal is calculated. The expected carrier frequency of the satellite navigation signal is compared with the estimated carrier frequency of the satellite navigation signal and a frequency offset value is calculated as the difference between the expected and estimated carrier frequencies of the satellite navigation signal. The frequency offset value is stored in a memory and used to compensate the frequency offset of at least one subsequent measurement.
Public/Granted literature
- US20110187594A1 Method for Self-Calibration of Frequency Offsets Public/Granted day:2011-08-04
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