Invention Grant
- Patent Title: Adjacent terminal fault detection
- Patent Title (中): 相邻终端故障检测
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Application No.: US13893138Application Date: 2013-05-13
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Publication No.: US08643983B2Publication Date: 2014-02-04
- Inventor: Yury Gaknoki , Yue Zhang , Mingming Mao
- Applicant: Power Integrations, Inc.
- Applicant Address: US CA San Jose
- Assignee: Power Integrations, Inc.
- Current Assignee: Power Integrations, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Morrison & Foerster LLP
- Main IPC: H02H9/02
- IPC: H02H9/02

Abstract:
This relates to detecting unwanted couplings between a protected terminal and other terminals in an integrated controller of a power supply. Offset and clamp circuitry may apply a positive or negative offset voltage and clamp current to one or more terminals of the controller. In the event that a terminal having the offset voltage and clamp current is accidentally coupled to the protected terminal, the offset voltage and clamp current may be applied to the protected terminal. The protected terminal may be coupled to a fault detection circuitry operable to detect a fault signal at the protected terminal. The fault detection circuitry of the controller may cause the power supply to shut down in response to a detection of the fault signal at the protected terminal or may cause the power supply to shut down in response to a detection of a predefined threshold number of cycles in which the fault signal is detected.
Public/Granted literature
- US20130250457A1 ADJACENT TERMINAL FAULT DETECTION Public/Granted day:2013-09-26
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