Invention Grant
US08643988B1 ESD power clamp using a low-voltage transistor to clamp a high-voltage supply in a mixed-voltage chip
有权
使用低压晶体管的ESD功率钳位钳位混合电压芯片中的高压电源
- Patent Title: ESD power clamp using a low-voltage transistor to clamp a high-voltage supply in a mixed-voltage chip
- Patent Title (中): 使用低压晶体管的ESD功率钳位钳位混合电压芯片中的高压电源
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Application No.: US13625986Application Date: 2012-09-25
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Publication No.: US08643988B1Publication Date: 2014-02-04
- Inventor: Kwok Kuen (David) Kwong
- Applicant: Kwok Kuen (David) Kwong
- Applicant Address: HK Hong Kong
- Assignee: Hong Kong Applied Science & Technology Research Institute Company Ltd.
- Current Assignee: Hong Kong Applied Science & Technology Research Institute Company Ltd.
- Current Assignee Address: HK Hong Kong
- Agency: gPatent LLC
- Agent Stuart T. Auvinen
- Main IPC: H02H9/00
- IPC: H02H9/00 ; H01C1/00 ; H02H1/04 ; H02H3/22 ; H02H9/06

Abstract:
An electro-static-discharge (ESD) protection circuit is a power clamp between a high-voltage power supply VDDH and a ground. The power clamp protects high-voltage transistors in a first core and low-voltage transistors in a second core using a low-voltage clamp transistor. The low-voltage transistors have lower power-supply and snap-back voltages than the high-voltage transistors. Trigger circuits are triggered when an ESD pulse is detected on VDDH. One trigger circuit enables a gate of the low-voltage clamp transistor. A series of diodes connected between VDDH and a drain of the clamp transistor prevents latch up or snap-back during normal operation. During an ESD pulse, the series of diodes is briefly bypassed by a p-channel bypass transistor when a second trigger circuit activates an initial trigger transistor which pulses the gate of the p-channel bypass transistor low for a period of time set by an R-C network in the second trigger circuit.
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