Invention Grant
US08644101B2 Local sense amplifier circuit and semiconductor memory device including the same
失效
本地读出放大器电路和包括其的半导体存储器件
- Patent Title: Local sense amplifier circuit and semiconductor memory device including the same
- Patent Title (中): 本地读出放大器电路和包括其的半导体存储器件
-
Application No.: US13360932Application Date: 2012-01-30
-
Publication No.: US08644101B2Publication Date: 2014-02-04
- Inventor: In-Woo Jun , Won-Chang Jung
- Applicant: In-Woo Jun , Won-Chang Jung
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2011-0009989 20110201
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A local sense amplifier circuit in a semiconductor memory device, the local sense amplifier circuit including a local data sensing unit configured to amplify a voltage difference between a local input/output (I/O) line pair based on a local sensing enable signal to provide the amplified voltage difference to a global I/O line pair, the local I/O line pair including a first local I/O line and a second local I/O line, and a local I/O line control unit including a first capacitor and a second capacitor, the first capacitor increasing a voltage level of the first local I/O line based on the local sensing enable signal, the second capacitor increasing a voltage level of the second local I/O line based on the local sensing enable signal.
Public/Granted literature
- US20120195146A1 LOCAL SENSE AMPLIFIER CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME Public/Granted day:2012-08-02
Information query