Invention Grant
- Patent Title: Header region evaluation circuit, optical disk apparatus, and header region evaluation method
- Patent Title (中): 标题区域评估电路,光盘装置和标题区域评估方法
-
Application No.: US13619638Application Date: 2012-09-14
-
Publication No.: US08644122B2Publication Date: 2014-02-04
- Inventor: Kinji Kayanuma
- Applicant: Kinji Kayanuma
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2011-235956 20111027
- Main IPC: G11B27/36
- IPC: G11B27/36

Abstract:
A header region evaluation circuit includes a difference signal detection unit that detects a difference signal proportional to a difference in amounts of received light from an optical disc, a high pass filter that switches a plurality of cutoff frequencies according to a passband control signal, removes a low frequency component from the difference signal, and generates a difference signal HPF output, a waveform shaping unit that generates a shaping signal to convert the difference signal HPF output into a pulse, and a physical header detection sequencer that generates a groove detection signal for evaluating whether the physical header region is either one of a groove and an inter-groove and generates a passband control signal for controlling the cutoff frequency to be reduced for a difference signal corresponding to at least a part of the physical header region.
Public/Granted literature
- US20130107689A1 HEADER REGION EVALUATION CIRCUIT, OPTICAL DISK APPARATUS, AND HEADER REGION EVALUATION METHOD Public/Granted day:2013-05-02
Information query