Invention Grant
- Patent Title: X-ray imaging apparatus and method of X-ray imaging
- Patent Title (中): X射线成像装置和X射线成像方法
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Application No.: US12993087Application Date: 2010-01-15
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Publication No.: US08644449B2Publication Date: 2014-02-04
- Inventor: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant: Taihei Mukaide , Kazuhiro Takada , Kazunori Fukuda , Masatoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc. IP Division
- Priority: JP2009-006848 20090115; JP2009-264412 20091119
- International Application: PCT/JP2010/050749 WO 20100115
- International Announcement: WO2010/082688 WO 20100722
- Main IPC: G03H5/00
- IPC: G03H5/00 ; G01N23/04

Abstract:
Provided is an X-ray imaging apparatus and a method of X-ray imaging, with which the apparatus can be reduced in size and a with which differential phase image or a phase image with consideration of an X-ray absorption effect of an object can be obtained.A displacement of X-rays that have been split by a splitting element and have passed through an object is measured. The displacement can be measured by using a first attenuation element having a transmission amount that continuously changes in accordance with the incident position of X-rays. At this time, an X-ray transmittance of an object that is calculated by using a second attenuation element having a transmission amount that does not change in accordance with the incident position of X-rays is used.
Public/Granted literature
- US20110064196A1 X-RAY IMAGING APPARATUS AND METHOD OF X-RAY IMAGING Public/Granted day:2011-03-17
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