Invention Grant
US08644547B2 Image analysis platform for identifying artifacts in samples and laboratory consumables
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用于识别样品和实验室耗材中的人造物的图像分析平台
- Patent Title: Image analysis platform for identifying artifacts in samples and laboratory consumables
- Patent Title (中): 用于识别样品和实验室耗材中的人造物的图像分析平台
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Application No.: US13129273Application Date: 2009-11-16
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Publication No.: US08644547B2Publication Date: 2014-02-04
- Inventor: Peter Hodder , Louis Daniel Scampavia , Pierre Elliott Baillargeon
- Applicant: Peter Hodder , Louis Daniel Scampavia , Pierre Elliott Baillargeon
- Applicant Address: US CA La Jolla
- Assignee: The Scripps Research Institute
- Current Assignee: The Scripps Research Institute
- Current Assignee Address: US CA La Jolla
- Agency: Duane Morris LLP
- Agent Nicholas A. Zachariades
- International Application: PCT/US2009/064565 WO 20091116
- International Announcement: WO2010/057081 WO 20100520
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N21/55

Abstract:
A High-resolution Image Acquisition and Processing Instrument (HIAPI) performs at least five simultaneous measurements in a noninvasive fashion, namely: (a) determining the volume of a liquid sample in well (or microtubes) containing liquid sample, (b) detection of precipitate, objects or artifacts within microliter plate wells, (c) classification of colored samples in microliter plate wells or microtubes; (dl determination of contaminant (e.g. wafer concentration}; (e) air bubbles; (f) problems with the actual plate. Remediation of contaminant is also possible.
Public/Granted literature
- US20110255745A1 IMAGE ANALYSIS PLATFORM FOR IDENTIFYING ARTIFACTS IN SAMPLES AND LABORATORY CONSUMABLES Public/Granted day:2011-10-20
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