Invention Grant
US08644574B2 Measurement of thin-layered structures in X-ray computer tomography
有权
X射线计算机断层扫描中薄层结构的测量
- Patent Title: Measurement of thin-layered structures in X-ray computer tomography
- Patent Title (中): X射线计算机断层扫描中薄层结构的测量
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Application No.: US12444188Application Date: 2007-10-03
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Publication No.: US08644574B2Publication Date: 2014-02-04
- Inventor: Raúl San José Estépar , George R. Washko , Edwin K. Silverman , John J. Reilly , Ron Kikinis , Carl-Fredrik Westin
- Applicant: Raúl San José Estépar , George R. Washko , Edwin K. Silverman , John J. Reilly , Ron Kikinis , Carl-Fredrik Westin
- Applicant Address: US MA Boston
- Assignee: The Brigham and Women's Hospital, Inc.
- Current Assignee: The Brigham and Women's Hospital, Inc.
- Current Assignee Address: US MA Boston
- Agency: Fish & Richardson P.C.
- International Application: PCT/US2007/080259 WO 20071003
- International Announcement: WO2008/042934 WO 20080410
- Main IPC: G06K9/36
- IPC: G06K9/36
Abstract:
A method for reconstructing an image includes receiving tomographic data representative of an image signal; deriving, from the image signal, a plurality of components; identifying a spatial location associated with maximum phase congruency of the components; incorporating, into an image, an edge at the spatial location; and providing an output representative of the image.
Public/Granted literature
- US20100172558A1 MEASUREMENT OF THIN-LAYERED STRUCTURES IN X-RAY COMPUTER TOMOGRAPHY Public/Granted day:2010-07-08
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